International Workshop organized by Prof. Fabrizio Carbone (EPFL, Switzerland) and Alexey Kuzmenko (UniGe, Switzerland) from 3rd to 5th June 2020 in Nyon (Switzerland).
Electron-energy loss spectroscopy (EELS) and scanning near-field optical microscopy (SNOM) are powerful and rapidly developing techniques to study various spatially and temporally textured excitations in solids and molecules, such as plasmons. While they ultimately yield similar information on such modes using respectively electrons and photons as probing particles, the mechanism through which these techniques do so can be radically different. The goal of this workshop is to bring together EELS and SNOM experts in order to exchange on the recent progress in these methods and to discuss their possible symbiosis. The topics will cover fundamental research, instrumentation, modelling and applications.